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University of Illinois Calls on Tektronix for Aid in Nanofabrication Lab

Undergraduate lab at the University of Illinois selects Keithley 4200A-SCS parameter analyzers to give students hands-on experience.

Tektronix, provider of measurement solutions, announced that the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign has purchased three Keithley 4200A-SCS Parameter Analyzers and three 4200A-CVIV Multi-Switch Modules for an undergraduate nanofabrication lab intended to give students hands-on experience with micro- and nano-electronics. The 4200A-SCS is a modular, fully integrated parameter analyzer for performing electrical characterization of materials, semiconductor devices and processes. The 4200A-CVIV provides an error-proof method of switching between DC and AC measurements and moving AC measurements to any terminal of the test device.

Illinois is in the process of setting up a nanofab lab at its ECE Building, a new 230,000-square-foot facility with more than 20 lab spaces dedicated to giving students hands-on training in electronics and computing. The university selected the 4200A-SCS for the nanofab lab because it wanted equipment that students and new users can immediately use with minimal training. Recently introduced, the 4200A-SCS emphasizes usability with features such as:

  • guidance on measurements with embedded YouTube-like videos in Chinese, English, Japanese and Korean on how to set up, perform and troubleshoot tests as well as application notes and webinars;
  • over 450 ready-to-use, user-modifiable application tests and devices that jumpstart test plan development;
  • visual test plan development and test sequencing tools; and
  • an integrated confidence check that gives users confirmation when a probe has contacted wafer pads.
Consisting of Source Measure Units for I-V characterization, Capacitance-Voltage module for AC impedance measurements, and an Ultra-fast Pulse Measure Unit that performs pulsed I-V, waveform capture and transient I-V measurements, the 4200A-SCS provides parameters needed for materials research, semiconductor device design, development or production.

For more info, visit Tektronix.

Sources: Press materials received from the company.

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