Global Metrology Services Report Available
September 17, 2014
The market is predicted to grow at a rate of 8.2% until 2018.
Siemens LMS Test.Lab 14 Now Available
September 17, 2014
The latest version is equipped for more targeted engineering insights and detailed problem analysis, the company states.
Coordinate Metrology Society Holds 30th Anniversary Conference
September 3, 2014
The event hosted speakers from The Boeing Company, Lockheed Martin, National Institute of Standards and Technology and more.
Presto Engineering Expands RF Capacities
September 2, 2014
The semiconductor turnkey production company has added new radio frequency device testing in San Jose, CA, and France.
Keysight Technologies Begins Operations
August 19, 2014
The company will operate as a subsidiary of Agilent Technologies until November.
National Instruments Announces Semiconductor Test System Series
August 6, 2014
Features include a customizable operator interface, handler/prober integration and device-centric programming.
ACS Adds Regulatory Compliance Center in North Carolina
August 5, 2014
The facility features a semi-anechoic chamber and an Open Area Test Site.
Ease of Use Drives 3D Scanner Adoption in Engineering
August 1, 2014
The 3D scanning market is getting bigger, even as the scanners themselves are getting smaller.
Toshiba Expands Motor Driver Integrated Circuit Offerings
July 31, 2014
The new devices incorporate over-current detection, thermal shutdown circuitry and an under-voltage lockout circuit.
HBM Launches Integrated eDrive Test System for Electric Motor, Inverter Analysis
July 28, 2014
The platform generates real-time data and can take measurements from as many as 18 current and voltage channels.
Pickering Expands PCI Precision Programmable Resistor Solutions
July 23, 2014
The company has added two new simulator cards to its product line.
VPT Adds Radiation Lab and Testing Services Facility
July 15, 2014
The facility services the aerospace electronics manufacturing sector.
Hexagon Metrology Releases HP-O Scanning Solution
July 14, 2014
The non-contact probe has a measurement range of up to 20mm and a scanning speed of 1,000 points per second.
Nanolab Technologies Acquires Microtech Laboratories LLC
July 11, 2014
The two companies both offer analytical services in the semiconductor industries.
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Benchmark Study: Optimized Drop Testing with Dell, Intel and Altair
July 11, 2014
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