Cray Selects ASSET’s ScanWorks Platform for Embedded Diagnostics in Next-Generation Supercomputers

By DE Editors

Cray Inc. has selected ASSET InterTech’s ScanWorks platform for embedded instrumentation as the basis for embedded test solutions for Cray’s next-generation of supercomputers. Cray will collaborate with ASSET and ASSET will deliver embedded test logic intellectual property that will support high-reliability and remote diagnostics in Cray’s supercomputers.

“ASSET’s ScanWorks platform provides a rich set of functionality for embedded diagnostics,” said Peg Williams, senior vice president of Research and Development at Cray. “ScanWorks-based solutions will enable Cray’s next-generation product development to maintain a focus on quality and reliability, while continuing to push the envelope in scalability. This is a real differentiator for Cray’s next-generation supercomputers and we believe it will give us a competitive advantage in the marketplace.”

ScanWorks’ embedded IP provides fault isolation in high-availability, mission-critical systems in the computer, telecom, military and aerospace, and storage markets. Its capabilities include single and multi-processor bring-up, remote test, kernel dump, hung system debug, and breakpoints.

For more information, visit ASSET InterTech.

Sources: Press materials received from the company and additional information gleaned from the company’s website.