National Instruments Releases TestStand Semiconductor Module

National Instruments (NI), a provider of platform based systems, has released the TestStand Semiconductor Module, which provides tools for developing, deploying and maintaining semiconductor test systems.

The module lets engineers program lab characterization systems with the same programming paradigm that is deployed on their factory floor with the Semiconductor Test System (STS). Users can also build their own rack-and-stack systems for semiconductor production test using PXI and TestStand beyond the the conventional architecture of the STS, the company states. The TestStand module includes:

• Multisite programming for reuse of code across a scalable number of test sites.
• Pin map editor including both PXI and third-party instrumentation.
• Standard Test Data Format (STDF) result processor for industry-standard logging of parametric test results.

“NI continues to lower the cost of semiconductor test through open software and modular hardware,” said Ron Wolfe, NI vice president of Semiconductor Test. “In 2014 we introduced the STS, which added semiconductor-specific features on top of the open, industry-standard PXI platform. Today, we’re improving the productivity of test development through a TestStand module designed specifically for the needs of semiconductor test from characterization to production.”

For more information, visit National Instruments.

Sources: Press materials received from the company and additional information gleaned from the company’s website.