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UEI Adds Flying Probe Tester for Prototypes

New equipment offers high accuracy and reduction of test time.

New equipment offers high accuracy and reduction of test time.

By DE Editors

Universal Electronics (UEI) has increased its in-house testing capabilities by adding a SPEA Flying Probe tester. The Flying Probe enables UEI to increase its capability in prototypes while providing quicker turnaround times, assuring quality in the manufacturing process with enhanced accuracy and diagnostic depth. It can help reduce start-up and tooling costs until a design is stable and ready for manufacturing.  
 
UEI testing services now include In-Circuit Testing (ICT), Automated Optical Inspection (AOI), x-ray, functional testing, and Flying Probe. UEIs test development strategy can occur in parallel with your product development team, or during product startup including prototypes and NPI.
 
For more information, visit Universal Electronics.

Sources: Press materials received from the company and additional information gleaned from the company’s website.
 

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DE Editors

DE’s editors contribute news and new product announcements to Digital Engineering.
Press releases may be sent to them via [email protected].

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