Digital Engineering 24/7

Helping design and engineering professionals discover, evaluate and specify technologies and processes that shorten the design cycle and enable success.

Metris' Focus Adds Speed and Versatility to Digital Inspection

Accelerating and simplifying metrology, functionality packaged into Focus Inspection.

By DE Editors  

October 8, 2008

By DE Editors

Metris (Leuven, Belgium) released Focus Scan 5.1 and Inspection 9.1, which streamline the digital inspection process and embed it into the CAD-centric design-through-manufacturing process, saving both time and money. Metris Focus is a fully featured software suite for point cloud data acquisition and inspection. For noncontact 3D metrology applications, Focus reduces manual operation and offers analysis flexibility. They require a short learning curve for novice users while providing advanced users with powerful processing capabilities, says the company.

Advantages of the digital inspection process, during which automated measurement and inspection routines run on the acquired digital model data of the part, include data collection any operator can perform, a fast procedure with full flexibility.

Point cloud datasets are at the core of the digital inspection process, as they represent digital copies of the measured objects.

Focus Scan 5.1 speeds up data acquisition and CMM-based measurement and Focus Scan Off-line automatically generates laser scanner motion path and head orientation on the basis of CAD data. Focus also reads in product manufacturing information (PMI) from CAD to calculate feature tolerance information.

Focus Scan 5.1 supports Metris LC60D, the new laser scanner that the company says triples traditional scan rates and eliminates user interaction when scanning components with varying color or high reflectivity. Focus Inspection 9.1 increases postprocessing versatility, and includes CAD importers update to ACIS R18 and extended best-fit capabilities to facilitate automation and eliminate manual interaction.

For details, contact Metris.

For previous DE coverage, read “Metris Releases CAMIO 6.0 Multi-sensor Metrology Software,” (Oct. 2008). and “Metris LC60D Premieres at IMTS,” (Sept. 2008).

Sources: Press materials received from the company and additional information gleaned from the company's website.

 

About DE Editors

DE Editors

DE's editors contribute news and new product announcements to Digital Engineering. Press releases may be sent to them via [email protected].

Follow DE
on Facebook
on Linkedin

Related Topics

Simulate   News   All topics
 

Subscribe

Subscribe to our FREE magazine, FREE email newsletters or both!

Join over 90,000 engineering professionals who get fresh engineering news as soon as it is published.

Subscribe today

 
 

From our Sponsors

Meltio Takes Metal Additive to the Next Level
Meltio's DED technology enables industries to tailor and customize their solutions to create & repair metal parts.
Easing the Transition from ETO to CTO with Configuration Lifecycle Management
Manufacturers are discovering that the Configure-to-Order (CTO) model provides significant benefits when it comes to customization.
Siemens + Altair = The Next Chapter in Design and Simulation
With its acquisition of Altair, Siemens creates a unified simulation portfolio combining generative design with high-performance computing and AI workflows.