National Instruments Releases Automated Test Outlook

National Instruments (NI), a provider of platform-based systems for engineering, has released the Automated Test Outlook 2016. This annual test and measurement report provides key trends expected to impact automated test environments with the proliferation of connected devices, the company states.

Topics included in the report are:

• Computing: Harvesting Production Test Data

  Semiconductor organizations pioneer real-time data analytics to reduce manufacturing test cost.

• Software: Lifecycle Management Is All About Software

  Obsolescence, OS churn, and compatibility challenge long lifecycle projects — an age-old problem warrants revisiting.

• Architecture: The Rise of Test Management Software

  Off-the-shelf test executives are effective solutions for the influx of new programming languages.

• I/O: Standardizing Platforms from Characterization to Production

  RFIC companies employ IP (intellectual property) reuse and hardware standardization across the product design cycle to reduce cost and shorten time to market.

• Business Strategy: Making Waves in Test Strategy

  Test managers are adopting modular solutions to economically validate high-frequency components.

“As strong advocates for excellence in automated test, we work closely with customers and suppliers to understand the top issues facing manufacturing and test departments,” said Luke Schreier, director of Automated Test Marketing at NI. “Whether your challenge is testing millions of Internet of Things devices or managing a 20-year-old test system, our goal is to spark dialogue within your organization to help you lower the cost of test and stay ahead of your competition.”

For more information, visit National Instruments.

Sources: Press materials received from the company and additional information gleaned from the company’s website.