CMS members, industry guests and users of portable measurement technology delivered white papers and application presentations at the 2017 conference. The agenda included speakers from NASA - Johnson Space Center, Triumph Aerostructures - Vought Aircraft Division, IK4-TEKNIKER (Spain), Idaho Virtualization Laboratory, Lawrence Berkeley National Laboratory, Brookhaven National Laboratory, National Institute for Standards and Technology (NIST), National Physical Laboratory (NPL- UK), Los Alamos National Laboratory, Argonne National Laboratory, University of North Carolina - Charlotte, University College London, Academy of Opto-electronics, Chinese Academy of Sciences and Tianjin University. During CMSC, delegates discussed the latest developments including a wide range of applications from close-range photogrammetry in space to metrology-guided wing join automation to point cloud measurements on a CMM artifact using a laser scanner.
During the conference, Randy Gruver, CMS certification chair, presented updates on the society's career enhancement programs including the CMS Level-One and Level-Two Certification examinations and future certifications in the works. Professor Ed Morse, UNC Charlotte, presented an update for the Precision Path Consortium's Roadmap for Large scale Manufacturing, a collaboration of industry, CMS and UNC Charlotte. Robert Schlader from the Idaho Virtualization Laboratory also presented "Digital Heritage and the Idaho Virtualization Lab; what is it, what does it mean, and why do it?"
In the CMSC Exhibition Hall, more than 40 exhibitors featured the latest trends in close-tolerance, industrial coordinate measurement systems, software, peripherals and services.
For more info, visit the Coordinate Metrology Society.
Sources: Press materials received from the company.


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