Digital Engineering 24/7

Helping design and engineering professionals discover, evaluate and specify technologies and processes that shorten the design cycle and enable success.

Alert!

Digital Engineering ceased publication on July 1, 2026. This website remains available as an archive of engineering content.

For inquiries or information, please email [email protected].

Keithley Introduces High Voltage System SourceMeter

Instrument is optimized for high power semiconductor tests.

By DE Editors  

March 26, 2012

By DE Editors

Keithley Instruments has introduced the Model 2657A High Power System SourceMeter instrument. The Model 2657A adds high voltage to the companys Series 2600A System SourceMeter family of high speed, precision source measurement units.

A built-in 3,000V, 180W source allows the device to source up to five times as much power to a device under test as the nearest competitive system, at significantly lower cost. The precision, high speed 6-1/2-digit measurement engine built into the Model 2657A enables 1fA (femtoamp) current measurement resolution to support the low-leakage requirements of next-generation power semiconductor devices.

The instrument is optimized for high voltage applications such as testing power semiconductor devices, including diodes, FETs, and IGBTs, as well as characterizing newer materials such as gallium nitride (GaN), silicon carbide (SiC), and other compound semiconductor materials and devices. It is also useful for characterizing high speed transients and performing breakdown and leakage tests on a variety of electronic devices at up to 3,000V.

The device provides a choice of digitizing or integrating measurement modes for characterizing both transient and steady-state behavior, including rapidly changing thermal effects. Each mode is defined by two independent analog-to-digital (A/D) converters "one for current and the other for voltage "that run simultaneously to ensure accurate source readback without sacrificing test throughput. The digitizing measurement modes 18-bit A/D converters support one-microsecond-per-point sampling, so users can capture voltage and current transients simultaneously. The integrating measurement mode, based on 22-bit A/D converters and common to all Series 2600A instruments, optimizes the Model 2657As operation for applications that demand the highest measurement accuracy and resolution.

For more information, visit Keithley Instruments.

Sources: Press materials received from the company and additional information gleaned from the company's website.


 

Latest in Test and Measurement

About DE Editors

DE Editors

DE's editors contribute news and new product announcements to Digital Engineering. Press releases may be sent to them via [email protected].

Follow DE
on Facebook
on Linkedin

Related Topics

Simulate   News   Products   Test and Measurement   All topics
 

Subscribe

Subscribe to our FREE magazine, FREE email newsletters or both!

Join over 90,000 engineering professionals who get fresh engineering news as soon as it is published.

Subscribe today

 
 

From our Sponsors

Meltio Takes Metal Additive to the Next Level
Meltio's DED technology enables industries to tailor and customize their solutions to create & repair metal parts.
Easing the Transition from ETO to CTO with Configuration Lifecycle Management
Manufacturers are discovering that the Configure-to-Order (CTO) model provides significant benefits when it comes to customization.
Siemens + Altair = The Next Chapter in Design and Simulation
With its acquisition of Altair, Siemens creates a unified simulation portfolio combining generative design with high-performance computing and AI workflows.