With the VSA's bandwidth, engineers can analyzes signals such as radar pulses, LTE-advanced transmissions and 802.11ac waveforms in a single acquisition. Additionally, the VSA's measurement speed helps decrease time to market and lower testing costs. The device can also be programmed with LabVIEW system design software to customize instrument behavior and address advanced RF (radio frequency) test applications.
The new 20 GHz signal generation has a tuning time of 100 µs and addresses applications such as block/interferer generation, high-performance intermodulation distortion test benches. It also is suitable for a host of electronic warfare applications.
“The NI 20 GHz PXI source offers an excellent combination of phase noise and tuning time in a small form factor – a perfect combination for testing our next-generation radar systems,” said Lennart Berlin, senior specialist for microwave measurement techniques at Saab AB.
For more information, visit National Instruments.
Sources: Press materials received from the company and additional information gleaned from the company’s website.

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