Digital Engineering 24/7

Helping design and engineering professionals discover, evaluate and specify technologies and processes that shorten the design cycle and enable success.

Alert!

Digital Engineering ceased publication on July 1, 2026. This website remains available as an archive of engineering content.

For inquiries or information, please email [email protected].

Keithley Publishes Seventh Edition of Low Level Measurements Handbook

Includes information on measurement tools for nanoscale devices and high-power semiconductors.

By DE Editors  

February 3, 2014

By DE Editors

Keithley Instruments has published the seventh edition of its "Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements." This 250-page reference, which Keithley first published in 1972, describes theoretical and practical considerations involved in the measurement of low DC currents, high resistances, low DC voltages, and low resistances.

Among other updates, the seventh edition incorporates information on the latest electrical measurement tools and techniques, including those developed for characterizing nanoscale devices and high-power semiconductors.

Section 1 offers an overview of the expanding range of low-level DC measuring instruments now available to scientists and engineers, including the electrometer, digital multimeter (DMM), nanovoltmeter, picoammeter, source measure unit (SMU) instrument, low current preamp, micro-ohmmeter, and low current source. Sections 2 and 3 delve into techniques and sources of error related to measurements from high resistance and low resistance sources respectively. Both sections include a measurement optimization summary that allows readers to identify likely sources of measurement error and troubleshooting techniques at a glance. Section 4 provides useful information on configuring test setups for a wide range of low level measurement applications.

The handbook concludes with an updated instrument selection guide, an illustrated cable and connector assembly guide, glossary, and test system safety reference.

For more information, visit Keithley Instruments.

Sources: Press materials received from the company and additional information gleaned from the company's website.

 

Latest in Test and Measurement

About DE Editors

DE Editors

DE's editors contribute news and new product announcements to Digital Engineering. Press releases may be sent to them via [email protected].

Follow DE
on Facebook
on Linkedin

Related Topics

Uncategorized   News   Products   Test and Measurement   All topics
 

Subscribe

Subscribe to our FREE magazine, FREE email newsletters or both!

Join over 90,000 engineering professionals who get fresh engineering news as soon as it is published.

Subscribe today

 
 

From our Sponsors

Meltio Takes Metal Additive to the Next Level
Meltio's DED technology enables industries to tailor and customize their solutions to create & repair metal parts.
Easing the Transition from ETO to CTO with Configuration Lifecycle Management
Manufacturers are discovering that the Configure-to-Order (CTO) model provides significant benefits when it comes to customization.
Siemens + Altair = The Next Chapter in Design and Simulation
With its acquisition of Altair, Siemens creates a unified simulation portfolio combining generative design with high-performance computing and AI workflows.