Digital Engineering 24/7

Helping design and engineering professionals discover, evaluate and specify technologies and processes that shorten the design cycle and enable success.

Metris Inspect-X 1.5 Streamlines CT Data Collection and Analysis

Reliable CT data in the shortest possible time

By DE Editors  

October 24, 2008

By DE Editors

Metris (Leuven, Belgium) launched Inspect-X 1.5 software that streamlines system operation in both Computed Tomography (CT) applications and X-ray electronics inspection.

The software offers a new integrated setup wizard for optimized CT data acquisition. Overall CT reconstruction time to a 3D volume model is reduced to minutes through the Metris-developed fast reconstruction engine. In addition, radical software enhancements for electronics inspection facilitate operation and automation, which further improve inspection accuracy and repeatability.

For industrial and electronics CT, Inspect-X 1.5 embeds a redesigned and streamlined wizard that leads the user through the CT setup process as simply and easily as possible. The emphasis is clearly on ease of use, as it only takes a few mouse clicks between sample insertion and CT data availability. Simplified user operation includes automatic parameter recommendations that enable everyone to capture accurate CT data in the shortest possible time. To increase the productivity of repeated CT, existing setups can be saved and reused on the spot, increasing the throughput of samples to be scanned using identical or similar inspection conditions.

Inspect-X 1.5 speeds up CT reconstruction by embedding an optimized reconstruction algorithm that is designed for fast and accurate operation. For electronic components and PCBs, Inspect-X 1.5 incorporates automated inspection functions that increase consistency and eliminate programming skills. Plus, Inspect-X increases sample-to-sample repeatability by introducing flux calibration, which normalizes image brightness to a uniform level in areas surrounding the zone of interest.

Inspect-X 1.5 features an automatic software algorithm for XT V 160 electronics inspection systems that optimizes filament current management to extend filament life. On average, optimum filament operating conditions approximately double filament life, considering equal use of the system.

For details, contact Metris.

Sources: Press materials received from the company and additional information gleaned from the company’s website.

 

About DE Editors

DE Editors

DE's editors contribute news and new product announcements to Digital Engineering. Press releases may be sent to them via [email protected].

Follow DE
on Facebook
on Linkedin

Related Topics

Simulate   News   Products   All topics
 

Subscribe

Subscribe to our FREE magazine, FREE email newsletters or both!

Join over 90,000 engineering professionals who get fresh engineering news as soon as it is published.

Subscribe today

 
 

From our Sponsors

Meltio Takes Metal Additive to the Next Level
Meltio's DED technology enables industries to tailor and customize their solutions to create & repair metal parts.
Easing the Transition from ETO to CTO with Configuration Lifecycle Management
Manufacturers are discovering that the Configure-to-Order (CTO) model provides significant benefits when it comes to customization.
Siemens + Altair = The Next Chapter in Design and Simulation
With its acquisition of Altair, Siemens creates a unified simulation portfolio combining generative design with high-performance computing and AI workflows.