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DE Editors · February 18, 2008 · Best entries to be posted online; winner wins an iPod touch.
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DE Editors · February 18, 2008 · PerfectDisk 2008 disk defragmentation tools get Microsoft certification.
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DE Editors · February 18, 2008 · Successful field trials confirm accelerated seismic migration processing.
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DE Editors · February 18, 2008 · The TPC-30T is a QVGA TFT LCD XScale PXA270 starting at $310.
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DE Editors · February 18, 2008 · Contains tutorials that simplify choosing solutions for specific test and measurement applications.
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DE Editors · February 18, 2008 · Aras provides advanced SOA solutions for enterprise PLM.
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DE Editors · February 18, 2008 · Validated motor design and reduced heat sink weight.
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DE Editors · February 18, 2008 · The MxK28335 from Technosoft is modular in structure.
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DE Editors · February 14, 2008 · More efficient, cleaner, cost cutting technologies that present new ways to prototype and manufacture products.
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DE Editors · February 14, 2008 · New CRP office to introduce company’s motor sports capabilites to U.S. market.
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DE Editors · February 14, 2008 · Enhanced features include new rapid prototyping blog.
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DE Editors · February 14, 2008 · Optics companies combine rapid prototyping and lens manufacturing strengths.
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DE Editors · February 14, 2008 · Innovation results in high end features in a less expensive system.
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DE Editors · February 14, 2008 · Rapid prototyping design tool enables efficient design of metal delivery shafts.
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DE Editors · February 14, 2008 · Leica Geosystems’ Absolute Tracker offers substantial advances in thermal stability.
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DE Editors · February 14, 2008 · Automated noise filtering program revolutionizes 3D scanning process.
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DE Editors · February 13, 2008 · Apps include simulation model verification, RP, and HIL testing.
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DE Editors · February 13, 2008 · 16-channel 250kHz 16-bit data acquisition cards offer simultaneous sampling and streaming to PC.
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DE Editors · February 13, 2008 · Enhancements to GibbsCAM plus focus on high-speed machining.
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DE Editors · February 13, 2008 · They can expose EMC issues early in the design process.